Thermal characterization of vertically-oriented carbon nanotubes on silicon

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2005, Pages 292-297

  Hu, Xuejiao ^a   Padilla, Antonio A ^a   Xu, Jun ^b   Fisher, Timothy S ^b   Goodson, Kenneth E ^a  

^a Stanford University   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

3 Omega method; Carbon nanotube; Contact thermal resistance; Thermal conductivity; Thermal interface material; Thermal management

Indexed keywords

INTERFACES (MATERIALS); SEMICONDUCTING SILICON; SUBSTRATES; THERMAL CONDUCTIVITY; THERMOANALYSIS;

3-OMEGA METHOD; CONTACT THERMAL RESISTANCE; THERMAL INTERFACE MATERIALS; THERMAL MANAGEMENT;

CARBON NANOTUBES;

EID: 28144449755     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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