Micro X-ray flourescence instrument developed in combination with atomic force microscope

Powder Diffraction

Volumn 20, Issue 2, 2005, Pages 137-140

  Tsuji, K ^a   Emoto, T ^a   Matsuoka, Y ^a   Miyatake, Y ^b   Nagamura, T ^b   Ding, X ^c  

^a Osaka Prefecture University   (Japan)

^b Japan Science and Technology Agency   (Japan)

^c BEIJING NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM CANTILEVERS; MICRO-X-RAY; MICRO-XRF; POLYCAPILLARY LENS; POLYCAPILLARY X-RAY LENS; X RAY BEAM; X-RAY FLOURESCENCE;

INSTRUMENTS; X RAYS;

ATOMIC FORCE MICROSCOPY;

EID: 28044472615     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1913724     Document Type: Conference Paper

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