Scanning tunneling microscope tip current excited by modulated X-rays

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 4 SUPPL. A, 1998, Pages 2028-2032

  Tsuji, Kouichi ^a   Nagamura, Toshihiko ^b   Wagatsuma, Kazuaki ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b Japan Science and Technology Agency   (Japan)

Author keywords

Electron emission; Modulation frequency; Scanning tunneling microscope; X ray excited current; X ray irradiation

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC CURRENT MEASUREMENT; ELECTRON EMISSION; FREQUENCY MODULATION; SURFACE STRUCTURE; X RAY ANALYSIS;

LOCK IN AMPLIFIER; X RAY CHOPPER; X RAY MODULATION TECHNIQUE;

SCANNING TUNNELING MICROSCOPY;

EID: 0032049685     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.2028     Document Type: Article

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