Study of single-nucleotide polymorphisms by means of electrical conductance measurements

Proceedings of the National Academy of Sciences of the United States of America

Volumn 102, Issue 47, 2005, Pages 16979-16983

  Hihath, Joshua ^a   Xu, Bingqian ^a   Zhang, Peiming ^b   Tao, Nongjian ^a  

^a Arizona State University   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Molecular electronics; Scanning tunneling microscope break junction

Indexed keywords

DNA BASE; DOUBLE STRANDED DNA;

AQUEOUS SOLUTION; ARTICLE; BASE MISPAIRING; BASE PAIRING; DNA BINDING; DNA HELIX; DNA MODIFICATION; DNA STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRODE; MEASUREMENT; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SINGLE NUCLEOTIDE POLYMORPHISM;

DNA; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODES; MICROSCOPY, SCANNING TUNNELING; POLYMORPHISM, SINGLE NUCLEOTIDE; TEMPERATURE;

EID: 28044470947     PISSN: 00278424     EISSN: None     Source Type: Journal    
DOI: 10.1073/pnas.0505175102     Document Type: Article

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