Oxidative DNA damage through long-range electron transfer

Nature

Volumn 382, Issue 6593, 1996, Pages 731-735

  Hall, D B ^a   Holmlin, R E ^a   Barton, J K ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE STRANDED DNA; RHODIUM;

ARTICLE; DNA DAMAGE; ELECTRON TRANSPORT; OXIDATION REDUCTION POTENTIAL; OXIDATIVE STRESS; PHOTOOXIDATION; PRIORITY JOURNAL;

BASE SEQUENCE; DNA; DNA DAMAGE; ELECTRON TRANSPORT; INTERCALATING AGENTS; MOLECULAR SEQUENCE DATA; OXIDATION-REDUCTION; PHOTOLYSIS; RHODIUM;

EID: 0029833916     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/382731a0     Document Type: Article

References (0)