Testing of ultra low voltage CMOS microprocessors using the Superconducting Single-Photon Detector (SSPD)

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2005, Pages 2-

  Stellari, Franco ^a   Song, Peilin ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28044458080     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. J.A. Kash and J.C. Tsang, "Dynamic Internal Testing of CMOS Circuits Using Hot Luminescence", IEEE Electron Dev. Let., vol. 18, no. 7, 1997, pp. 330-332
2. W.G. McMullan, S. Charbonneau and M.L.W. Thewalt, "Simultaneous subnanosecond timing information and 2D spatial information from imaging photomultiplier tubes", Review of Scientific Instruments, vol. 58, no. 9, 1987, pp. 1626-1628.
3. F. Stellari and P. Song, "Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector", European Symposium on Reliability of Electron Devices, 2004, pp. 1663-1668.
4. W.K. Lo, et al., "Next-Generation Optical Probing Tools for Design Debug of High Speed Integrated Circuits", ISTFA, 2002, pp. 753-762.