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Volumn 82, Issue 3-4 SPEC. ISS., 2005, Pages 333-340

Precursor chemistry for ULK CVD

Author keywords

PECVD; Porogens; Silicon based precursors; ULK materials

Indexed keywords

CHEMICAL BONDS; DIFFUSION; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POROSITY; THIN FILMS; VAPORS;

EID: 28044441574     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2005.07.071     Document Type: Conference Paper
Times cited : (29)

References (19)
  • 2
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    • Air Products, US Patent #6,716,770
    • M. O'Neill et al., Air Products, US Patent #6,716,770, 2004.
    • (2004)
    • O'Neill, M.1
  • 6
    • 28044455515 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Montpellier, France
    • B. Remiat, Ph.D. Thesis, University of Montpellier, France, 2003.
    • (2003)
    • Remiat, B.1
  • 10
    • 0348199056 scopus 로고    scopus 로고
    • Materials Technology and Reliability for Advanced Interconnects and Low-k Dielectrics Symposium 2003
    • R. Vrtis, M. O'Neill, J. Vincent, L. Lukas, B. Peterson, M. Bitner, and E. Karwacki Materials Technology and Reliability for Advanced Interconnects and Low-k Dielectrics Symposium 2003 Mater. Res. Soc. 766 2003 259
    • (2003) Mater. Res. Soc. , vol.766 , pp. 259
    • Vrtis, R.1    O'Neill, M.2    Vincent, J.3    Lukas, L.4    Peterson, B.5    Bitner, M.6    Karwacki, E.7
  • 11
    • 28044440151 scopus 로고    scopus 로고
    • IBM, US Patent #6,790,789
    • A. Grill et al., IBM, US Patent #6,790,789, 2004.
    • (2004)
    • Grill, A.1
  • 15
    • 28044438260 scopus 로고    scopus 로고
    • Intel Corp., US Patent #6,734,533
    • Wong et al., Intel Corp., US Patent #6,734,533, 2004.
    • (2004)
    • Wong1
  • 17
    • 28044466050 scopus 로고    scopus 로고
    • Air Products, US Patent #6,846,515
    • R. Vrtis et al., Air Products, US Patent #6,846,515, 2005.
    • (2005)
    • Vrtis, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.