Nanolithography based contacting method for electrical measurements on single template synthesized nanowires

Nanotechnology

Volumn 16, Issue 12, 2005, Pages 2936-2940

  Fusil, S ^a   Piraux, L ^b   Matefi Tempfli S ^b   Matefi Tempfli M ^b   Michotte, S ^b   Saul, C K ^c,d   Pereira, L G ^c   Bouzehouane, K ^c   Cros, V ^c   Deranlot, C ^c   George, J M ^c  

^a UNIVERSITÉ D EVRY VAL D ESSONNE   (France)

^b Unite de Physico Chimie et de Physique des Materiaux   (Belgium)

^c UNITÉ MIXTE DE PHYSIQUE CNRS THALES   (France)

^d FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CURRENT DENSITY; ELECTRIC VARIABLES MEASUREMENT; ELECTRODEPOSITION; NANOSTRUCTURED MATERIALS;

ELECTRICAL SPIN INJECTION; MAGNETIC NANOSTRUCTURES; NANOINDENDATION; THIN INSULATING RESIST;

NANOTECHNOLOGY;

EID: 27944488643     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/16/12/036     Document Type: Article

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