메뉴 건너뛰기




Volumn , Issue , 2005, Pages 717-722

An accurate probabilistic model for error detection

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION PROBABILITIES; ESTIMATION TIME;

EID: 27944486186     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVD.2005.46     Document Type: Conference Paper
Times cited : (29)

References (17)
  • 1
    • 0142184763 scopus 로고    scopus 로고
    • Cost-effective approach for reducing soft error failure rate in logic circuits
    • K. Mohanram and N. A. Touba, "Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits," International Test Conference, 2003, pp. 893-901.
    • (2003) International Test Conference , pp. 893-901
    • Mohanram, K.1    Touba, N.A.2
  • 4
    • 0027794338 scopus 로고
    • A BDD-based algorithm for computation of exact fault detection probabilities
    • June
    • R. Krieger, B. Becker and R. Sinkovic, "A BDD-based Algorithm for computation of exact fault detection probabilities," Digest of Papers, Fault-Tolerant Computing, vol. 22-24, June 1993, pp. 186-195.
    • (1993) Digest of Papers, Fault-tolerant Computing , vol.22-24 , pp. 186-195
    • Krieger, R.1    Becker, B.2    Sinkovic, R.3
  • 6
    • 0003263179 scopus 로고
    • Propagation of uncertainty by probabilistic logic sampling in Bayes' networks
    • M. Henrion, "Propagation of uncertainty by probabilistic logic sampling in Bayes' networks," Uncertainty in Artificial Intelligence, 1988.
    • (1988) Uncertainty in Artificial Intelligence
    • Henrion, M.1
  • 7
    • 0034848097 scopus 로고    scopus 로고
    • Dependency preserving probabilistic modeling of switching activity using Bayesian networks
    • Jun.
    • S. Bhanja and N. Ranganathan, "Dependency preserving probabilistic modeling of switching activity using Bayesian networks" Design Automation Conference, Jun. 2001.
    • (2001) Design Automation Conference
    • Bhanja, S.1    Ranganathan, N.2
  • 11
    • 27944472258 scopus 로고
    • On computing the detection probability of stuck-at faults in a combinational circuit
    • Sep.
    • B. P. Philips, "On computing the detection probability of stuck-at faults in a combinational circuit," IEEE system readiness Technology Conference, vol. 24-26, Sep. 1991, pp. 301-305.
    • (1991) IEEE System Readiness Technology Conference , vol.24-26 , pp. 301-305
    • Philips, B.P.1
  • 15
    • 0025521547 scopus 로고
    • On computing signal probability and detection probability of stuck-at faults
    • Nov.
    • S. Chakravarty and H. B. hunt, III, "On computing signal probability and detection probability of stuck-at faults," IEEE Transactions on Computers, vol. 39-11, Nov. 1990pp. 1369-1377.
    • (1990) IEEE Transactions on Computers , vol.39 , Issue.11 , pp. 1369-1377
    • Chakravarty, S.1    Hunt III, H.B.2
  • 16
    • 0027885585 scopus 로고
    • A generalized algorithm for bounding fault detection probabilities in combinational circuits
    • Sep.
    • R. Pathak, "A generalized algorithm for bounding fault detection probabilities in combinational circuits," AUTOTESTCON, Proceedings of IEEE Systems Readiness Technology Conference, vol. 20-23, Sep. 1993, pp. 683-689.
    • (1993) AUTOTESTCON, Proceedings of IEEE Systems Readiness Technology Conference , vol.20-23 , pp. 683-689
    • Pathak, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.