Application specific worst case corners using response surfaces and statistical models

Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004

Volumn , Issue , 2004, Pages 351-356

  Sengupta, Manidip ^a   Saxena, Sharad ^a   Daldoss, Lidia ^a   Kramer, Glen ^a   Minehane, Sean ^a   Cheng, Jianjun ^a  

^a PDF Solutions   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; FUNCTIONS; LAGRANGE MULTIPLIERS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS;

PROCESS PARAMETERS; RESPONSE SURFACES; STATISTICAL VARIATIONS;

INTEGRATED CIRCUITS;

EID: 2942677101     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2004.1283699     Document Type: Conference Paper

References (13)

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