Josephson junctions with nearly superconducting metal silicide barriers

Applied Physics Letters

Volumn 87, Issue 22, 2005, Pages 1-3

  Chong, Yonuk ^a   Hadacek, N ^b   Dresselhaus, P D ^b   Burroughs, C J ^b   Baek, B ^b   Benz, S P ^b  

^a Korea Research Institute of Standards and Science   (South Korea)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MODEL SYSTEM; NONHYSTERIC JUNCTIONS; SILICIDE BARRIER; VOLTAGE STANDARD;

CONTROLLABILITY; ELECTRIC POTENTIAL; ELECTRICAL ENGINEERING; MATHEMATICAL MODELS; SILICON COMPOUNDS; THERMAL EFFECTS;

SUPERCONDUCTIVITY;

EID: 27944464013     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2137992     Document Type: Article

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