Effect of thallium on the optical properties and structure of thtn As-S-TI films

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 5, 2005, Pages 2587-2594

  Petkov, K ^a   Todorov, R ^a   Kincl, M ^b   Tichy, L ^b  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

^b UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Chalcogenide thin films; Infrared spectroscopy; Optical properties

Indexed keywords

ENERGY GAP; INFRARED SPECTROSCOPY; OPTICAL GLASS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SUBSTRATES; THALLIUM; THERMAL EVAPORATION;

AS-DEPOSITED FILMS; CHALCOGENIDE THIN FILMS; DISPERSION ENERGIES; OPTICAL PARAMETER; OSCILLATOR ENERGY; REFLECTION MEASUREMENTS; SINGLE-OSCILLATOR MODEL; SPECTROSCOPY MEASUREMENTS;

THIN FILMS;

EID: 27844479117     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (28)

1. P. J. S. Ewen, A. E. Owen, in: M. Cabal and J. M. Parker (Eds.), High Performance Glasses, Blackie, London, 1992, p. 287.
2. A. M. Andriesh, D. I. Tsiulyanu, J. Non-Crist. Solids 97&98, 1135 (1987).
3. K. Tanaka, Appl. Phys. Lett. 26, 243 (1975).
4. K. Tanaka, Solid State Commun. 34, 201 (1980).
5. A. B. Seeddon, J. Non-Cryst. Solids, 184, 44 (1995).
6. K. Petkov, J. Optoelectron. Adv. Mater. 4, 611 (2002).
7. R. Todorov, Tz. Iliev, K Petkov, J. Non-Cryst. Solids. 326-327, 263 (2003).
8. M. A. El Idrissi Raghni, J.-M. Durand, B. Bonnet, L Hafid, J. Olivier-Fourcade, J. C. Jumas, J. Alloys Comp. 239, 8 (1996).
9. M. A. El Idrissi Raghni, B. Bonnet, M. L. Hafid, J. Olivier-Fourcade, J. C. Jumas, J. Alloy Comp. 260, 7 (1997).
10. P. E. Lippens, M. A. El Idrissi Raghni, J. Olivier-Fourcade, J. C. Jumas, J. Alloys Comp. 298, 47 (2000).
11. J.-M. Durand, J. Olivier-Fourcade, J. C. Jumas, M. Womes, P. Parent, J Mater. Sci. 32, 4679 (1997).
12. R. Todorov, K. Petkov, J. Optoelectron. Adv. Mater. 3, 311 (2001).
13. K. Petkov, E. Cernoskova, D. Kozhuharova, J. Optoelectron. Adv. Mater. 6, 149 (2004).
14. K. Petkov, R. Todorov, D. Kozhuharova, L. Tichy, E. Cernoskova, P. J. S. Ewen, J. Mater. Sci. 39, 961, (2004).
15. J. M. Harbold, F. O. Ilday, F. W. Wise, J. N. Sanghera, V. Q. Nguyen, L. B. Shaw, I. D. Aggarwal, Opt. Lett. 27, 119 (2002).
16. K. Petkov, J. P. S. Ewen, J. Non-Cryst. Solids, 249, 150 (1999).
17. R. Swanepoel, J. Phys. E: Sci. Instrum. 16, 1214 (1983).
18. I. Konstantinov, private communication, 1989.
19. S. H. Wemple, M. DiDomeniko, Phys. Rev. B 3, 1338 (1971).
20. S. H. Wemple, Phys. Rev. B 7, 3767 (1973).
21. J. Tauc, Amorphous and liquid semiconuctors (Plenum Press) New York 1974
22. U. Storm, T. Martin, Solid St. Com. 29, 527 (1979).
23. T. I. Kosa, T. Wagner, P. J. S. Ewen, A. E. Owen, Phil. Mag. B, 71, 311 (1995).
24. E. Marquez, J. M. Gonzalez-Leal, R. Jimenez-Garay, S. R. Lukic, D.M. Petrovic, J. Phys. D: Appl. Phys. 30, 690 (1997).
25. K. Tanaka Thin Solid Films 66, 271 (1986).
26. S. A. Fayek, S. S. Fouad, Vacuum, 52, 359 (1999).
27. N. F. Mott, E. A. Davis, "Electronic Processes in Non-Crystalline Materials", Clarendon Press, Oxford, 1979.
28. W. Zhou, M. A. Paesler, D. E. Sayers, Phys. Rev. B, 46, 3817 (1992).