Changes in the physicochemical and optical properties of chalcogenide thin films from the systems As-S and As-S-Tl

Journal of Materials Science

Volumn 39, Issue 3, 2004, Pages 961-968

  Petkov, K ^a   Todorov, R ^a   Kozhuharova, D ^a   Tichy, L ^b   Cernoskova, E ^b   Ewen, P J S ^c  

^a CENTRAL LABORATORY OF PHOTOPROCESSES   (Bulgaria)

^b UNIVERSITY OF PARDUBICE   (Czech Republic)

^c UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); ENERGY GAP; EVAPORATION; GLASS TRANSITION; LIGHT REFLECTION; LIGHT TRANSMISSION; MICROHARDNESS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SUBSTRATES; VACUUM;

CHALCOGENIDE FILMS; OPTICAL BAND GAP;

THIN FILMS;

EID: 1042300849     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000012928.38384.f8     Document Type: Conference Paper

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