Optimization of system reliability robustness using accelerated degradation testing

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2005, Pages 48-54

  Liao, Haitao ^a,c,d,e   Elsayed, Elsayed A ^b,f,g  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c University of Wisconsin Milwaukee   (United States)

^d IEEE   (United States)

^e IEE ^*  (United States)

^f DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

^g ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Accelerated degradation testing; Reliability robustness; Testing plan

Indexed keywords

ACCELERATED DEGRADATION TESTING; RELIABILITY ROBUSTNESS; TESTING PLAN; VARIANCE-COVARIANCE MATRIX;

DATA REDUCTION; MATHEMATICAL MODELS; OPTIMIZATION; PARAMETER ESTIMATION; ROBUSTNESS (CONTROL SYSTEMS); UNCERTAIN SYSTEMS; CONDITION MONITORING; OPTIMAL SYSTEMS; RELIABILITY; STATISTICAL METHODS;

RELIABILITY; SYSTEMS ANALYSIS;

EID: 27744593013     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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