Analyzing experiments with degradation data for improving reliability and for achieving robust reliability

Quality and Reliability Engineering International

Volumn 17, Issue 5, 2001, Pages 333-344

  Chiao, Chih Hua ^a   Hamada, Michael ^b  

^a SOOCHOW UNIVERSITY   (Taiwan)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Control and noise factors; Loss function; Maximum likelihood; Product array; Random effects model; Robust parameter design

Indexed keywords

HIGH-RELIABILITY PRODUCTS;

COMPUTER SIMULATION; DATA REDUCTION; FAILURE ANALYSIS; MAXIMUM LIKELIHOOD ESTIMATION; PRODUCT DESIGN; RELIABILITY;

QUALITY CONTROL;

EID: 0035441514     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.412     Document Type: Article

References (13)

1. Analysis of experiments for reliability improvement and robust reliability
2. Using degradation data from a fractional factorial experiment to improve fluorescent lamp reliability
3. Using degradation data from an experiment to achieve robust reliability for light emitting diodes
4. Using degradation measures to estimate a time-to-failure distribution
5. Computer experiments for quality control by parameter design
6. Approximations to the log-likelihood function in the nonlinear mixed-effects model
7. Nonlinear mixed effects models for repeated measures data