Characterization of interfacial properties in magnetic tunnel junctions by bias-dependent complex impedance spectroscopy

IEEE Transactions on Magnetics

Volumn 41, Issue 10, 2005, Pages 3643-3645

  Hsu, C Y ^a,b   Huang, J C A ^a,b,c  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^c NATIONAL UNIVERSITY OF KAOHSIUNG   (Taiwan)

Author keywords

Bias dependent impedence; Magnetic tunnel junctions; Tunnel magnetoresistance

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; MIM DEVICES; SCHOTTKY BARRIER DIODES;

BIAS-DEPENDENT IMPEDANCE; MAGNETIC TUNNEL JUNCTIONS; PARALLEL RESISTANCE; TUNNEL MAGNETORESISTANCE;

TUNNEL JUNCTIONS;

EID: 27744589000     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.854712     Document Type: Article

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