Complex capacitance spectroscopy as a probe for oxidation process of AlOx -based magnetic tunnel junctions

Applied Physics Letters

Volumn 85, Issue 24, 2004, Pages 5947-5949

  Huang, J C A ^a,b,c   Hsu, C Y ^a,b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^c NATIONAL UNIVERSITY OF KAOHSIUNG   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DIELECTRIC RELAXATION; ELECTRIC IMPEDANCE; ELECTRODES; INTERFACES (MATERIALS); OXIDATION; SPECTROSCOPIC ANALYSIS;

BARRIER QUALITY; COMPLEX CAPACITANCE SPECTROSCOPY; DEBYE RELAXATION; METAL INSULATOR INTERFACES;

TUNNEL JUNCTIONS;

EID: 20444492821     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1835534     Document Type: Article

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