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Volumn 36, Issue 1, 2005, Pages 159-186

Applying process knowledge for yield variation reduction: A longitudinal field study

Author keywords

Longitudinal Field Study; Process Knowledge; Time Series Analysis; Yield Variation Reduction

Indexed keywords


EID: 27744588688     PISSN: 00117315     EISSN: 15405915     Source Type: Journal    
DOI: 10.1111/j.1540-5915.2005.00069.x     Document Type: Review
Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.