Sequential screening in semiconductor manufacturing, I: Exploiting spatial dependence

Operations Research

Volumn 44, Issue 1, 1996, Pages 173-195

  Longtin, Mark D ^a   Wein, Lawrence M ^b   Welsch, Roy E ^b  

^a Merrill Lynch Inc   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; INVENTORY CONTROL; MARKOV PROCESSES; MATHEMATICAL MODELS; OPTIMIZATION; PROBABILITY; PRODUCTION CONTROL; QUALITY CONTROL; SEMICONDUCTOR DEVICE MANUFACTURE;

MARKOV RANDOM FIELDS; OPTIMAL CHIP SCREENING POLICY; QUANTITY CONTROL; SEQUENTIAL SCREENING; WAFER FABRICATION;

OPERATIONS RESEARCH;

EID: 0029752372     PISSN: 0030364X     EISSN: None     Source Type: Journal    
DOI: 10.1287/opre.44.1.173     Document Type: Article

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