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Volumn 45, Issue 7, 2005, Pages 476-484
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Stochastic and relaxation processes in argon by measurements of dynamic breakdown voltages
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Author keywords
Argon; Distributions; Electrical breakdown; Linearly rising pulses; Relaxation
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Indexed keywords
ELECTRIC BREAKDOWN;
IONIZATION OF GASES;
KINETICS;
RANDOM PROCESSES;
RELAXATION PROCESSES;
STOCHASTIC SYSTEMS;
AFTERGLOW KINETICS;
DELAY TIME;
DISTRIBUTION;
ELECTRICAL BREAKDOWN;
ELECTRON YIELD;
LINEARLY RISING PULSE;
MEASUREMENTS OF;
RELAXATION;
SURFACE RECOMBINATIONS;
TRANSIENT REGIME;
ARGON;
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EID: 27744568515
PISSN: 08631042
EISSN: None
Source Type: Journal
DOI: 10.1002/ctpp.200510053 Document Type: Article |
Times cited : (6)
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References (36)
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