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Volumn 32, Issue 16, 1999, Pages 2049-2055
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Breakdown delay times and memory effects in helium at low pressure
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Author keywords
[No Author keywords available]
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Indexed keywords
ANODES;
ELECTRIC POTENTIAL;
ELECTRONS;
GAS DISCHARGE TUBES;
GLOW DISCHARGES;
HELIUM;
PRESSURE;
STATISTICAL METHODS;
BREAKDOWN DELAY TIME;
FORMATIVE TIME LAG;
LOW PRESSURE HELIUM;
STATISTICAL DELAY TIME;
ELECTRIC BREAKDOWN OF GASES;
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EID: 0032593282
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/32/16/313 Document Type: Article |
Times cited : (41)
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References (21)
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