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Volumn 32, Issue 16, 1999, Pages 2049-2055

Breakdown delay times and memory effects in helium at low pressure

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ELECTRIC POTENTIAL; ELECTRONS; GAS DISCHARGE TUBES; GLOW DISCHARGES; HELIUM; PRESSURE; STATISTICAL METHODS;

EID: 0032593282     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/16/313     Document Type: Article
Times cited : (41)

References (21)
  • 3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.