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Volumn 5830, Issue , 2005, Pages 11-20

Characterization of plumes produced during ultrashort laser ablation of metals and semiconductors

Author keywords

Femtosecond; Laser ablation; Plume diagnostics

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; COMPOSITION; EMISSION SPECTROSCOPY; LASER ABLATION; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; PLASMAS; SEMICONDUCTOR MATERIALS; SILICON;

EID: 27744567986     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.617174     Document Type: Conference Paper
Times cited : (2)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.