Relaxation issues in nanoindentation experiments

Current Applied Physics

Volumn 6, Issue 2, 2006, Pages 154-160

  Nagy, P M ^a   Horvath P ^a   Aranyi, D ^a   Kalman E ^a  

^a Curriculum Resource Center Budapest   (Hungary)

Author keywords

AFM; Anisotropy; Image processing; Nanoindentation; Nanostructured coating; Relaxation; Thin layer; Titanium

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); ELASTIC MODULI; IMAGE PROCESSING; POLYCRYSTALLINE MATERIALS; THIN FILMS; TITANIUM;

NANOINDENDATATION; NANOSTRUCTURED COATING; RELAXATION; SENSING INDENTATION;

NANOTECHNOLOGY;

EID: 27744482102     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2005.07.030     Document Type: Conference Paper

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