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Transmission electron microscopy was performed on a Hitachi H-600 instrument operated at 100 kV and on a JEOL-2010 TEM operated at 200 kV at the Center for Nano Science & Technology (CNST). The ultrathin sections of POSS-PPV-co-MEHPPV copolymer prepared for TEM studies were microtomed using a Leica Ultracut Uct apparatus equipped with a diamond knife and subsequently deposited on copper grids. The microtomed thin films, corresponding to the section of the POSS-PPV-co-MEHPPV copolymer, were also observed using a Digital Nanoscope Ilia atomic force microscope (AFM).
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