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Volumn 35, Issue 6, 2002, Pages 2375-2379
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X-ray characterizations of polyethylene polyhedral oligomeric silsesquioxane copolymers
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Author keywords
[No Author keywords available]
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Indexed keywords
WIDE-ANGLE X-RAY SCATTERING (WAXS);
CRYSTAL LATTICES;
CRYSTALLIZATION;
DIFFRACTION;
HEAT RESISTANCE;
HIGH TEMPERATURE EFFECTS;
NANOSTRUCTURED MATERIALS;
OLIGOMERS;
POLYETHYLENES;
X RAY ANALYSIS;
X RAY SCATTERING;
COPOLYMERS;
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EID: 0037066252
PISSN: 00249297
EISSN: None
Source Type: Journal
DOI: 10.1021/ma011855e Document Type: Article |
Times cited : (300)
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References (27)
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