Novelmethods for preparing EC STM tips

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Kazinczi, R ^a   Szocs, E ^a   Kalman E ^a   Nagy, P ^b  

^a CTRL RES INSTITUTE FOR CHEMISTRY   (Hungary)

^b Institute for Material Science   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; DYNAMIC TECHNIQUES; ELECTROCHEMICAL ETCHING TECHNIQUES; ELECTROCHEMICAL STM; ETCHING RATE; FARADAIC CURRENT; POTENTIAL MEASUREMENTS; SCANNING TUNNELING MICROSCOPES; STATIC METHOD; TUNGSTEN TIP;

ETCHING; INSULATION; OPTICAL MICROSCOPY; RATE CONSTANTS; SCANNING ELECTRON MICROSCOPY; TUNGSTEN;

SCANNING TUNNELING MICROSCOPY;

EID: 0000724677     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051197     Document Type: Article

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3. J.O. Fiering, F.M. Ellis: Rev. Sci. Instrum. 61(12), 3911 (1990)
4. R.E.White, J.O'M. Bockris, B.E. Conway: Modern Aspects of Electrochemistry, No.21 (Plenum Press, New York 1990)