A scalable noise De-embedding technique for on-wafer microwave device characterization

IEEE Microwave and Wireless Components Letters

Volumn 15, Issue 10, 2005, Pages 649-651

  Cho, Ming Hsiang ^a,b   Huang, Guo Wei ^a,b   Wang, Yueh Hua ^a,c   Wu, Lin Kun ^a,c  

^a IEEE   (Taiwan)

^b NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Calibration; De embedding; MOSFET; Noise; S parameters

Indexed keywords

DE-EMBEDDING; DEVICE-UNDER-TESTS (DUT); INPUT/OUTPUT INTERCONENCTS; MICROWAVE MEASUREMENTS;

ACOUSTIC NOISE; CALIBRATION; MOSFET DEVICES; SCATTERING PARAMETERS; SILICON WAFERS; TRANSMISSION LINE THEORY;

MICROWAVE DEVICES;

EID: 27144503100     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2005.856685     Document Type: Article

References (9)

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