An automatic program suitable for on-wafer characterization and statistic analysis of microwave devices

61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003

Volumn , Issue , 2003, Pages 157-161

  Huang, G W ^a   Chiu, D Y ^a   Chen, K M ^a   Deng, Y M ^a   Wang, S C ^a  

^a NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHICAL USER INTERFACES; MICROWAVE DEVICES;

AGILENT; AUTOMATIC PROGRAMS; CIRCUIT DESIGNERS; GUI (GRAPHICAL USER INTERFACE); MACRO PROGRAM; MEASUREMENT ACCURACY; ON-WAFER; STATISTIC ANALYSIS;

MACROS;

EID: 84954236890     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGS.2003.1216880     Document Type: Conference Paper

References (0)