Evaluating the reliability of NAND multiplexing with PRISM

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 24, Issue 10, 2005, Pages 1629-1637

  Norman, Gethin ^a   Parker, David ^a   Kwiatkowska, Marta ^a   Shukla, Sandeep ^b  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Defect tolerant architectures; Multiplexing; Probabilistic model checking; Reliability

Indexed keywords

COMPUTER AIDED DESIGN; ERROR ANALYSIS; MATHEMATICAL MODELS; MULTIPLEXING; PROBABILISTIC LOGICS; RANDOM PROCESSES; RELIABILITY;

DEFECT-TOLERANT ARCHITECTURES; NAND MULTIPLEXING; PRISM; PROBABILISTIC-MODEL CHECKING;

NAND CIRCUITS;

EID: 27144487371     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.852033     Document Type: Article

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