Toward robust integrated circuits: The embryonics approach

Proceedings of the IEEE

Volumn 88, Issue 4, 2000, Pages 516-540

  Mange, Daniel ^a   Sipper, Moshe ^a   Stauffer, André ^a   Tempesti, Gianluca ^a  

^a EPFL   (Switzerland)

Author keywords

Built in self test; Embryonic electronics; Field programmable gale arrays (fpga's); Multiplexer based fpga's; Self replicating fpga's; Selfrepairing fpga's

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; CELLULAR ARRAYS; ELECTRONICS INDUSTRY; FIELD PROGRAMMABLE GATE ARRAYS; FINITE AUTOMATA; INTEGRATED CIRCUIT TESTING; MULTIPLEXING EQUIPMENT; VLSI CIRCUITS;

EMBRYONIC ELECTRONICS; MULTIPLEXER BASED FIELD PROGRAMMABLE GATE ARRAYS; SELF REPAIRING FIELD PROGRAMMABLE GATE ARRAYS; SELF REPLICATING FIELD PROGRAMMABLE GATE ARRAYS;

INTEGRATED CIRCUIT LAYOUT;

EID: 0034172002     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.842998     Document Type: Article

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