메뉴 건너뛰기




Volumn 493, Issue 1-2, 2005, Pages 160-169

Tribology of carbon nitride and boron nitride nanoperiod multilayer films and its application to nanoscale processing

Author keywords

Atomic force microscopy; Multilayers; Nitrides; Sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; BORON COMPOUNDS; FRACTURE; GRAPHITE; MULTILAYERS; NITRIDES; SPUTTERING; WEAR OF MATERIALS;

EID: 27144453581     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.284     Document Type: Article
Times cited : (21)

References (21)
  • 12
    • 0003692711 scopus 로고
    • Forces in Scanning Probe Methods
    • H.-J. Giintherodt D. Anselmetti E. Mayer Kluwer Academic Publishers Dordrecht, Netherlands
    • R. Kaneko, and M. Igarashi H.-J. Giintherodt D. Anselmetti E. Mayer Forces in Scanning Probe Methods NATO ASI Series E, Applied Sciences vol. 286 1995 Kluwer Academic Publishers Dordrecht, Netherlands 405
    • (1995) NATO ASI Series E, Applied Sciences , vol.286 , pp. 405
    • Kaneko, R.1    Igarashi, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.