Emissive infrared projector sparse grid non uniformity correction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5785, Issue , 2005, Pages 91-102

  Joyce, Robert A ^a   Świerkowski, Leszek ^a   Williams, Owen M ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Infrared projection; Nonuniformity correction; Sparse grid procedure

Indexed keywords

ARRAYS; CAMERAS; INFRARED DEVICES; LIGHT EMISSION; OPTICAL ENGINEERING; RESISTORS;

INFRARED PROJECTION; NONUNIFORMITY CORRECTION; RESISTOR ARRAYS; SPARSE GRID PROCEDURE;

OPTICAL PROJECTORS;

EID: 26844567187     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.603275     Document Type: Conference Paper

References (11)

1. L.Świerkowski, R.A. Joyce and O.M. Williams, "Emissive infrared projector temperature resolution limiting factors," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IX, Proc. SPIE Vol. 5408, 229-239 (2004).
2. R.G. Stockbridge, G.C. Goldsmith II, D.G. Edwards, A.G. Guertin, L.E. Jones and E.M. Olson, Characterization and nonuniformity correction of a resistor array infrared scene projector", in Characterization, Propagation, and Simulation of Sources and Backgrounds IV, Proc. SPIE Vol. 2223, 51-63 (1994).
3. L.E. Jones, E.M. Olson, R.L. Murrer Jr. and A.R. Andrews, "A simplified method for the hardware implementation of nonuniformity correction on a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing II, Proc. SPIE Vol. 3084, 139-150 (1997).
4. E.M. Olson and R.L. Murrer Jr., "Non-uniformity correction of a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE Vol. 3697, 403-413 (1999).
5. B. Sieglinger, J. Norman, W.M. Meshell, D.S. Flynn, R.A. Thompson and G.C. Goldsmith II, "Array nonuniformity correction - new procedures designed for difficult measurement conditions," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VIII, Proc. SPIE Vol. 5092, 210-220 (2003).
6. D. Hust and J. R. Lippert, "Automated NUC procedure for a 512×512 IR array using a 256×256 camera," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE Vol. 4366, 130-139 (2001).
7. R.A. Joyce, L.Świerkowski and O.M. Williams, "Infrared projector flood nonuniformity correction characteristics," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VIII, Proc. SPIE Vol. 5092, 185-195 (2003).
8. E.M. Olson and T.P. Bergin, "Nonuniformity correction using a flood technique and 1:1 mapping," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE Vol. 4366, 501-509 (2001).
9. L. Świerkowski and O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures II," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4027, 214-225 (2000).
10. L. Świerkowski and O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures III," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4366, 453-464 (2001).
11. L. Świerkowski and O.M. Williams, "Advanced flood nonuniformity correction for emitter array infrared projectors," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4717, 108-119 (2002).