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Volumn 4366, Issue , 2001, Pages 453-464

Search for optimal infrared projector nonuniformity correction procedures III

Author keywords

Dynamic infrared scene projection; Fixed pattern noise; Nonuniformity correction

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; INFRARED IMAGING; MOIRE FRINGES; OPTICAL TRANSFER FUNCTION;

EID: 0035148843     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.438095     Document Type: Conference Paper
Times cited : (6)

References (10)
  • 1
    • 0033358694 scopus 로고    scopus 로고
    • Search for optimal infrared projector nonuniformity correction procedures
    • Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV
    • (1999) Proc. SPIE , vol.3697 , pp. 352-365
    • Williams, O.M.1
  • 2
    • 0033684268 scopus 로고    scopus 로고
    • Search for optimal infrared projector nonuniformity correction procedures II
    • Technologies for Synthetic Environments: Hardware-in-the-loop Testing V
    • (2000) Proc. SPIE , vol.4027 , pp. 214-225
    • Świerkowski, L.1    Williams, O.M.2
  • 5
  • 6
    • 0033365907 scopus 로고    scopus 로고
    • Non-uniformity correction of a resistor array infrared scene projector
    • Technologies/or Synthetic Environments: Hardware-in-the-loop Testing IV
    • (1999) Proc. SPIE , vol.3697 , pp. 403-413
    • Olson, E.M.1    Murrer, R.L.2
  • 9
    • 0035151719 scopus 로고    scopus 로고
    • Automated NUC procedure for a 512 × 512 IR array using a 256 × 256 camera
    • Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, this issue
    • (2001) Proc. SPIE , vol.4366
    • Hust, D.1    Lippert, J.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.