Advanced flood nonuniformity correction for emitter array infrared projectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4717, Issue , 2002, Pages 108-119

  Świerkowski, Leszek ^a   Williams, Owen M ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Dynamic infrared scene projection; Fixed pattern noise; Nonuniformity correction

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; COMPUTER SOFTWARE; MAPPING; PROJECTION SYSTEMS; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE;

FLOOD NONUNIFORMITY PROCEDURES;

OPTICAL PROJECTORS;

EID: 0036030754     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.474712     Document Type: Conference Paper

References (14)

1. L.E. Jones, E.M. Olson, R.L. Murrer Jr. and A.R. Andrews, "A simplified method for the hardware implementation of nonuniformity corrections on a resistor-array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing II, Proc. SPIE 3084, 139-150 (1997).
2. E.M. Olson and R.L Murrer Jr. "Non-uniformity correction of a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE 3697, 403-413 (1999).
3. K.R. Allred, E.E. Burroughs, W. Pickard and K.G. LeSueur, "Real-time synthetic environments for HWIL testing," Proceedings of the High Performance Computing workshop, June 1998, http://www.dtc.army.mil/hpcw/1999/.
4. D. Hust and J.R. Lippert, "Automated NUC procedure for a 512 × 512 IR array using a 256 × 256 camera," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE 4366, 130-139 (2001).
5. O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE 3697, 352-365 (1999).
6. M.A. Venables, S.P. Lake, D.W. Gough and A.P. Pritchard, "Non-uniformity correction of resistor arrays with a precision projector/sensor mapping method," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE 3697, 414-421 (1999).
7. L. Świerkowski and O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures II," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE 4027, 214-225 (2000).
8. M.A. Venables, D.W. Gough and A.P. Pritchard, "Practical application of a 1:1 mapped NUC system for IRSP arrays," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE 4027, 226-235 (2000).
9. L. Świerkowski and O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures III," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE 4366, 453-464 (2001).
10. E.M. Olson and T.P. Bergin, "Nonuniformity correction using a flood technique and 1:1 mapping," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE 4366, 501-509 (2001).
11. M. Manzardo, E. Burroughs and T. Kelly, "Characterization of the Dynamic Infrared Scene Projector (DIRSP) Engineering Grade Array (DEGA)," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE 3697, 198-208 (1999).
12. O.M. Williams, "Dynamic infrared scene projection: the scene filtering and sampling problem revisited," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing III, Proc. SPIE 3368, 98-115 (1998).
13. O.M. Williams, L. Świerkowski, R.A. Thompson, G.C. Goldsmith II and W.L. Herald, "Process-based real-time scene data processor design for emitter projector infrared projectors," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VII, Proc. SPIE 4717 (this issue) (2002).
14. B. Cole, S. Weeres, R. Higashi, J. Ridley, J. Holmen and B. Johnson, "Honeywell resistor array development and future directions," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE 3697, 188-196 (1999).