Emissive infrared projector temperature resolution limiting factors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5408, Issue , 2004, Pages 229-239

  Świerkowski, Leszek ^a   Joyce, Robert A ^a   Williams, Owen M ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

Infrared projection; Nonuniformity correction; Temperature resolution

Indexed keywords

ARRAYS; CAMERAS; DATA PROCESSING; INFRARED DEVICES; INFRARED IMAGING; OPTICAL PROJECTORS; PROJECTION SYSTEMS; SIGNAL PROCESSING;

DATA COLLECTION; INFRARED PROJECTION; NONUNIFORMITY CORRECTION (NUC); TEMPERATURE RESOLUTION;

TEMPERATURE DISTRIBUTION;

EID: 10044257679     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.542937     Document Type: Conference Paper

References (17)

1. R.G. Stockbridge, G.C. Goldsmith II, D.G. Edwards, A.G. Guertin, L.E. Jones and E.M. Olson, Characterization and nonuniformity correction of a resistor array infrared scene projector", in Characterization, Propagation, and Simulation of Sources and Backgrounds IV, Proc. SPIE Vol. 2223, 51-63 (1994).
2. L.E. Jones, E.M. Olson, R.L. Murrer Jr. and A.R. Andrews, "A simplified method for the hardware implementation of nonuniformity correction on a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing II, Proc. SPIE Vol. 3084, 139-150 (1997).
3. E.M. Olson and R.L. Murrer Jr., "Non-uniformity correction of a resistor array infrared scene projector," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE Vol. 3697, 403-413 (1999).
4. O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE Vol. 3697, 352-365 (1999).
5. M.A. Venables, S.P. Lake, D.W. Gough and A.P. Pritchard, "Non-uniformity correction of resistor arrays with a precision projector/sensor mapping method," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing IV, Proc. SPIE Vol. 3697, 414-421 (1999).
6. K.R. Allred, E.E. Burroughs, W. Pickard and K.G. LeSueur, "Real-time synthetic environments for HWIL testing," Proceedings of the High Performance Computing workshop, June 1998, http://www.dtc.army.mil/ hpcw/1999/.
7. L. Świerkowski and O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures II," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4027, 214-225 (2000).
8. M.A. Venables, D.W. Gough and A.P. Pritchard, "Practical application of a 1:1 mapped NUC system for IRSP arrays," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4027, 226-235 (2000).
9. L. Świerkowski and O.M. Williams, "Search for optimal infrared projector nonuniformity correction procedures III," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4366, 453-464 (2001).
10. E.M. Olson and T.P. Bergin, "Nonuniformity correction using a flood technique and 1:1 mapping," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE Vol. 4366, 501-509 (2001).
11. D. Hust and J. R. Lippert, "Automated NUC procedure for a 512×512 IR array using a 256×256 camera," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VI, Proc. SPIE Vol. 4366, 130-139 (2001).
12. L. Świerkowski and O.M. Williams, "Advanced flood nonuniformity correction for emitter array infrared projectors," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing V, Proc. SPIE Vol. 4717, 108-119 (2002).
13. O.M. Williams, L.Świerkowski, R.A. Thompson, G.C. Goldsmith II and W.L. Herald, "Process-based real-time scene data processor design for emitter array infrared projectors," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VII, Proc. SPIE Vol. 4717, 120-135 (2002).
14. B. Sieglinger, J. Norman, W.M. Meshell, D.S. Flynn, R.A. Thompson and G.C. Goldsmith II, "Array nonuniformity correction - new procedures designed for difficult measurement conditions," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VIII, Proc. SPIE Vol. 5092, 210-220 (2003).
15. O.M. Williams, L.Świerkowski, A.J. Huber, J.D. Norman and G.C. Goldsmith II, "Infrared projector scene data real-time processor design," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VIII, Proc. SPIE Vol. 5092, 196-209 (2003).
16. R.A. Joyce, L.Świerkowski and O.M. Williams, "Infrared projector flood nonuniformity correction characteristics," in Technologies for Synthetic Environments: Hardware-in-the-loop Testing VIII, Proc. SPIE Vol. 5092, 185-195 (2003).
17. J.K. Ji, J.R. Yoon, and K. Cho, "Nonuniformity correction scheme for an infrared camera including the background effect due to camera temperature variation." Opt. Eng. 39, 936-940 (2000).