IR drop and ground bounce awareness timing model

Proceedings - IEEE Computer Society Annual Symposium on VLSI - New Frontiers in VLSI

Volumn , Issue , 2005, Pages 226-231

  Shao, Muzhou ^a   Gao, Youxin ^a   Yuan, Li Pen ^a   Wong, Martin D F ^b  

^a SYNOPSYS INC   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL FAILURES; GATE DRIVING; IC TECHNOLOGY; TIMING ANALYSIS;

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; GATES (TRANSISTOR); NETWORKS (CIRCUITS);

INTEGRATED CIRCUITS;

EID: 26844468118     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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