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Volumn 3419 LNAI, Issue , 2005, Pages 172-186

Constraint-based approaches to the covering test problem

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTATIONAL METHODS; COMPUTER HARDWARE; COMPUTER SOFTWARE; ENCODING (SYMBOLS); PROBLEM SOLVING;

EID: 26844458310     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11402763_13     Document Type: Conference Paper
Times cited : (36)

References (26)
  • 5
    • 0030242266 scopus 로고    scopus 로고
    • The combinatorial design approach to automatic test generation
    • D. M. Cohen, S. R. Dalal, J. Parelius, and G. C. Patton. The Combinatorial Design Approach to Automatic Test Generation. IEEE Software, 1996, pp. 83-86.
    • (1996) IEEE Software , pp. 83-86
    • Cohen, D.M.1    Dalal, S.R.2    Parelius, J.3    Patton, G.C.4
  • 11
    • 2942689600 scopus 로고    scopus 로고
    • Problems and algorithms for covering arrays
    • A. Hartman and L. Raskin. Problems and Algorithms for Covering Arrays. Discrete Mathematics 284:149-156, 2004.
    • (2004) Discrete Mathematics , vol.284 , pp. 149-156
    • Hartman, A.1    Raskin, L.2
  • 12
    • 80053489217 scopus 로고    scopus 로고
    • Reducing time to market with combinatorial design method testing
    • J. Huller. Reducing Time to Market With Combinatorial Design Method Testing. Proceedings of the 2000 International Council on Systems Engineering (INCOSE) Conference, 2000.
    • (2000) Proceedings of the , vol.2000
    • Huller, J.1
  • 18
    • 0037234574 scopus 로고    scopus 로고
    • Negative effects of modeling techniques on search performance
    • Kluwer Academic Publishers
    • S. D. Prestwich. Negative Effects of Modeling Techniques on Search Performance. Annals of Operations Research 118:137-150, Kluwer Academic Publishers, 2003.
    • (2003) Annals of Operations Research , vol.118 , pp. 137-150
    • Prestwich, S.D.1
  • 24
    • 0021385453 scopus 로고
    • Iterative exhaustive pattern generation for logic testing
    • D. T. Tang and C. L. Chen. Iterative Exhaustive Pattern Generation for Logic Testing. IBM Journal of Research and Development 28:212-219, 1984.
    • (1984) IBM Journal of Research and Development , vol.28 , pp. 212-219
    • Tang, D.T.1    Chen, C.L.2
  • 25
    • 0020929233 scopus 로고
    • Exhaustive test pattern generation with constant weight vectors
    • D. T. Tang and L. S. Woo. Exhaustive Test Pattern Generation With Constant Weight Vectors. IEEE Transactions Computers 32:1145-1150, 1983.
    • (1983) IEEE Transactions Computers , vol.32 , pp. 1145-1150
    • Tang, D.T.1    Woo, L.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.