Projected state machine coverage for software testing

Proceedings of the ACM SIGSOFT 2002 International Symposium on Software Testing and Analysis

Volumn , Issue , 2002, Pages 134-143

  Friedman, G ^a   Hartman, A ^b   Nagin, K ^b   Shiran, T ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b UNIVERSITY OF HAIFA   (Israel)

Author keywords

Automated test generation; Finite state machine modeling; State machine projection

Indexed keywords

ALGORITHMS; COMPUTER PROGRAMMING; COMPUTER SOFTWARE; DATA STRUCTURES; PROGRAM DEBUGGING;

FINITE STATE MACHINES (FSM);

SOFTWARE ENGINEERING;

EID: 0036986572     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/566171.566192     Document Type: Conference Paper

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