Combinatorial group testing methods for the BIST diagnosis problem

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2004, Pages 113-116

  Kahng, Andrew B ^a   Reda, Sherief ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIST DIAGNOSIS PROBLEM; COMBINATORIAL GROUP TESTING (CGT); DIGITAL LOGIC SYSTEMS;

ALGORITHMS; FIELD PROGRAMMABLE GATE ARRAYS; SET THEORY; VECTORS; VLSI CIRCUITS;

COMBINATORIAL CIRCUITS;

EID: 2442607764     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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