In-parameter-order: A test generation strategy for pairwise testing

Proceedings - 3rd IEEE International High-Assurance Systems Engineering Symposium, HASE 1998

Volumn 1998-November, Issue , 1998, Pages 254-261

  Lei, Yu ^a   Tai, K C ^b  

^a FUJITSU LABORATORIES OF AMERICA   (United States)

^b North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SYSTEMS ENGINEERING; TESTING;

INPUT PARAMETER; LOCAL OPTIMIZATIONS; PAIR-WISE TESTING; SOFTWARE SYSTEMS; SPECIFICATION BASED TESTING; TEST GENERATION ALGORITHM; TEST GENERATIONS; THREE PARAMETERS;

SOFTWARE TESTING;

EID: 85046437490     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HASE.1998.731623     Document Type: Conference Paper

References (5)

1. D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The combinatorial desgin approach to automatic test generation. IEEE Software, pages 83-87, September 1996.
2. D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG system: An approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437-443, July 1997.
3. D.M. Cohen, S.R. Dalal, A. Kajla, and G.C. Patton. The automatic efficient test generator. Proc. IEEE Int. Symp. Software Reliability Engineering, pages 303-309, 1994.
4. R. Mandl. Orthogonal latin squares: An application of experimental design to compiler testing. Comm. ACM, pages 1054-1058, October 1985.
5. A. W. Williams and R. L. Probert. A practical strategy for testing pair-wise coverage of network interfaces. Proc. IEEE Int. Symp. Software Reliability Engineering, pages 246-254, 1996.