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Interface Science
Volumn 9, Issue 1-2, 2001, Pages 83-92
Surface morphological evolution of thin films under stress and capillary forces
(1)
Génin, François Y
a
a
LAWRENCE LIVERMORE NATIONAL LABORATORY
(
United States
)
Author keywords
Capillary instabilities; Defects; Hillocks; Pitting; Thermal grooving; Thin films
Indexed keywords
ALUMINUM; COMPRESSIVE STRESS; CRYSTAL DEFECTS; DEPOSITION; GRAIN BOUNDARIES; HEAT TREATMENT; MAGNETIZATION; MORPHOLOGY; NUMERICAL METHODS; SURFACE STRUCTURE; TENSILE STRESS; THERMAL EXPANSION;
CAPILLARY FORCES; HILLOCKS; SURFACE MORPHOLOGICAL EVOLUTION; THERMAL EXPANSION MISMATCH; THERMAL GROOVING;
METALLIC FILMS;
EID
:
0035300532
PISSN
:
09277056
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1023/A:1011231131878
Document Type
:
Article
Times cited : (
11
)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.