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Volumn 202, Issue 12, 2005, Pages

Increased thermal conductivity of free-standing low-dislocation-density GaN films

Author keywords

[No Author keywords available]

Indexed keywords

ROOM TEMPERATURE; SAPPHIRE SUBSTRATES; THERMAL MANAGEMENT;

EID: 26444612157     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200521222     Document Type: Article
Times cited : (35)

References (11)
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    • Low flicker-noise GaN/A1GaN heterostructure field-effect transistors for microwave communications
    • A. Balandin et al., Low flicker-noise GaN/A1GaN heterostructure field-effect transistors for microwave communications, IEEE Trans. Microw. Theory Tech. 47, 1413-1417 (1999).
    • (1999) IEEE Trans. Microw. Theory Tech. , vol.47 , pp. 1413-1417
    • Balandin, A.1
  • 4
    • 0032614196 scopus 로고    scopus 로고
    • High spatial resolution thermal conductivity of lateral pitaxial overgrown GaN/sapphire (0001) using a scanning thermal microscope
    • V. M. Asnin et al., High spatial resolution thermal conductivity of lateral pitaxial overgrown GaN/sapphire (0001) using a scanning thermal microscope, Appl. Phys. Lett. 75, 1240-1242 (1999).
    • (1999) Appl. Phys. Lett. , vol.75 , pp. 1240-1242
    • Asnin, V.M.1
  • 5
    • 0035945104 scopus 로고    scopus 로고
    • Effect of dislocations on thermal conductivity of GaN layers
    • D. Kotchetkov et al., Effect of dislocations on thermal conductivity of GaN layers, Appl. Phys Lett., 79, 4316-4318 (2001).
    • (2001) Appl. Phys Lett. , vol.79 , pp. 4316-4318
    • Kotchetkov, D.1
  • 6
    • 0036733922 scopus 로고    scopus 로고
    • Thermal conductivity of GaN films: Effects of impurities and dislocations
    • J. Zou et al., Thermal conductivity of GaN films: effects of impurities and dislocations, J. Appl. Phys. 92, 2534-2539 (2002).
    • (2002) J. Appl. Phys. , vol.92 , pp. 2534-2539
    • Zou, J.1
  • 7
    • 0032048780 scopus 로고    scopus 로고
    • Scattering of electrons at threading dislocations in GaN
    • N. G. Weimann et al., Scattering of electrons at threading dislocations in GaN, J. Appl. Phys. 83, 3656-3659 (1998).
    • (1998) J. Appl. Phys. , vol.83 , pp. 3656-3659
    • Weimann, N.G.1
  • 8
    • 3242778633 scopus 로고    scopus 로고
    • Dislocation density of GaN grown by hydride vapor phase epitaxy
    • K. Y. Lee and K. H. Auh, Dislocation Density of GaN Grown by Hydride Vapor Phase Epitaxy, MRS Internet J. Nitride Semicond. Res. 6, 9 (2000).
    • (2000) MRS Internet J. Nitride Semicond. Res. , vol.6 , pp. 9
    • Lee, K.Y.1    Auh, K.H.2
  • 9
    • 26444555349 scopus 로고    scopus 로고
    • Preparation of free-standing GaN and GaN template by hydride vapor phase epitaxy
    • Proc. 21st Century COE Joint Workshop on Bulk Nitrides
    • H.-Y. Lee, C. H. Lee, and K. S. Lee, Preparation of Free-standing GaN and GaN Template by Hydride Vapor Phase Epitaxy, Proc. 21st Century COE Joint Workshop on Bulk Nitrides, IPAP Conf. Ser. 4, 25-27 (2003).
    • (2003) IPAP Conf. Ser. , vol.4 , pp. 25-27
    • Lee, H.-Y.1    Lee, C.H.2    Lee, K.S.3
  • 10
    • 11044229820 scopus 로고    scopus 로고
    • 1-xN thin films measured by the differential 3d technique
    • 1-xN thin films measured by the differential 3d) technique, Appl. Phys. Lett. 85, 5230-5232 (2004).
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    • Liu, W.L.1    Balandin, A.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.