Feature selection for partial discharge diagnosis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5768, Issue , 2005, Pages 166-175

  Yan, Weizhong ^a   Goebel, Kai F ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

Classification; Feature extraction; Feature selection; Partial discharge; PD diagnosis

Indexed keywords

CLASSIFICATION; FEATURE SELECTION; OPTIMAL CLASSIFICATION; PARTIAL DISCHARGE (PD) DIAGNOSTIC SYSTEMS; PD DIAGNOSIS;

FEATURE EXTRACTION; SYSTEMS ANALYSIS;

PARTIAL DISCHARGES;

EID: 25644451098     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.599819     Document Type: Conference Paper

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