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Volumn 24, Issue 7, 2005, Pages 839-843

Determining thermal expansion coefficient of stressed thin films at low temperature

Author keywords

Coefficient of thermal expansion; Low temperature; Stress; Thin film

Indexed keywords

CRYOGENICS; DESIGN; LOW TEMPERATURE EFFECTS; STRESSES; THERMAL EXPANSION;

EID: 25644444569     PISSN: 01429418     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymertesting.2005.06.014     Document Type: Article
Times cited : (8)

References (24)
  • 23
    • 25644451078 scopus 로고    scopus 로고
    • Composite Materials: Testing, Design, and Acceptance Criteria
    • A.T. Nettles A. Zureick American Society for Testing and Materials
    • H. Zhu, W. Li, and A.A. Tseng A.T. Nettles A. Zureick Composite Materials: Testing, Design, and Acceptance Criteria ASTM STP 1416 2002 American Society for Testing and Materials
    • (2002) ASTM STP 1416
    • Zhu, H.1    Li, W.2    Tseng, A.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.