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Volumn 43, Issue 2, 1998, Pages 141-148

Development of texture determination method for the near-surface-layers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032345429     PISSN: 08607052     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (7)
  • 6
    • 0028666468 scopus 로고
    • Equipment for texture measurement in thin films
    • Proc. ICOTOM-10, Ed. H. J. Bunge
    • J. Szpunar, P. Blandford, Equipment for texture measurement in thin films. Proc. ICOTOM-10, Ed. H. J. Bunge, Material Science Forum 157-162, 207, (1994).
    • (1994) Material Science Forum , vol.157-162 , pp. 207
    • Szpunar, J.1    Blandford, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.