메뉴 건너뛰기




Volumn 68, Issue 6, 2003, Pages

Diffraction patterns of stacked layer crystals

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; CORRELATION ANALYSIS; CRYSTAL STRUCTURE; FOURIER ANALYSIS; RANDOMIZATION; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0141505041     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.064111     Document Type: Article
Times cited : (18)

References (34)
  • 18
    • 84856389320 scopus 로고
    • R. L. Synder, J. Fiala, and H. J. Bunge (Oxford Science Publications, Oxford, Chap. 16
    • Z. Weiss and P. Capkova, in Defect and Microstructure Analysis by Diffraction, edited by R. L. Synder, J. Fiala, and H. J. Bunge (Oxford Science Publications, Oxford, 1994), Chap. 16.
    • (1994) Defect and Microstructure Analysis by Diffraction
    • Weiss, Z.1    Capkova, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.