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Volumn 66, Issue 17, 2002, Pages 1741101-1741104
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Discovering planar disorder in close-packed structures from x-ray diffraction: Beyond the fault model
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Author keywords
[No Author keywords available]
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Indexed keywords
ZINC SULFIDE;
ARTICLE;
CHEMICAL ANALYSIS;
CHEMICAL MODEL;
CHEMICAL STRUCTURE;
CRYSTAL STRUCTURE;
SPECTRUM;
TECHNIQUE;
X RAY DIFFRACTION;
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EID: 0036871444
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (49)
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References (28)
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