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Volumn 202, Issue 5, 2005, Pages

Multiplet luminescence of sulfur implanted silica - SiO 2:S

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DOPANT FRACTION; ELECTRONIC BEAM IRRADIATION; ELECTRONIC STATES; SULFUR IONS;

EID: 25444460847     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200510012     Document Type: Article
Times cited : (16)

References (8)
  • 1
    • 0003641685 scopus 로고    scopus 로고
    • Defects in SiO, and related dielectrics: Science and technology
    • Kluwer Academic, Dordrecht
    • G. Pacchioni, L. Skuja, and D. L. Griscom, Defects in SiO, and Related Dielectrics: Science and Technology, NATO Science Series (Kluwer Academic, Dordrecht, 2000).
    • (2000) NATO Science Series
    • Pacchioni, G.1    Skuja, L.2    Griscom, D.L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.