-
1
-
-
0036707194
-
Rule extraction from local cluster neural nets
-
ANDREWS, R. and GEVA, S., 2002, Rule extraction from local cluster neural nets. Neurocomputing, 47, 1-20.
-
(2002)
Neurocomputing
, vol.47
, pp. 1-20
-
-
Andrews, R.1
Geva, S.2
-
2
-
-
0004311217
-
-
San Francisco: Holden-Day
-
Box, G. E. P. and JENKINS, G. M., 1976, Time Series Analysis, Forecasting and Control, 2nd edn (San Francisco: Holden-Day).
-
(1976)
Time Series Analysis, Forecasting and Control, 2nd Edn
-
-
Box, G.E.P.1
Jenkins, G.M.2
-
3
-
-
0003410292
-
-
Englewood Cliffs, NT: Prentice-Hall
-
Box, G. E. P., JENKINS, G. M. and REINSEL, G., 1994, Time Series Analysis, Forecasting and Control, 3rd edn (Englewood Cliffs, NT: Prentice-Hall).
-
(1994)
Time Series Analysis, Forecasting and Control, 3rd Edn
-
-
Box, G.E.P.1
Jenkins, G.M.2
Reinsel, G.3
-
4
-
-
84893529721
-
Statistical process monitoring and feedback adjustment - A discussion
-
Box, G. E. P. and KRAMER, T., 1992, Statistical process monitoring and feedback adjustment - a discussion. Technometrics, 34, 251-285.
-
(1992)
Technometrics
, vol.34
, pp. 251-285
-
-
Box, G.E.P.1
Kramer, T.2
-
6
-
-
0000343716
-
Submodel selection and evaluation in regression: The X-random case
-
BREIMAN, L. and SPECTOR, P., 1992, Submodel selection and evaluation in regression: the X-random case. International Statistics Review, 60, 291-319.
-
(1992)
International Statistics Review
, vol.60
, pp. 291-319
-
-
Breiman, L.1
Spector, P.2
-
8
-
-
0028425441
-
Supervisory run-to-run control of a polysilicon gate etch using in situ ellipsometry
-
BUTLER, S. W. and STEFANI, J. A., 1994, Supervisory run-to-run control of a polysilicon gate etch using in situ ellipsometry. IEEE Transactions on Semiconductor Manufacturing, 7, 193-201.
-
(1994)
IEEE Transactions on Semiconductor Manufacturing
, vol.7
, pp. 193-201
-
-
Butler, S.W.1
Stefani, J.A.2
-
9
-
-
0036849496
-
Design and performance analysis of the exponentially weighted moving average mean estimate for processes subject to random step changes
-
CHEN, A. and ELSAYED, E. A., 2002, Design and performance analysis of the exponentially weighted moving average mean estimate for processes subject to random step changes. Technometrics, 44, 379-389.
-
(2002)
Technometrics
, vol.44
, pp. 379-389
-
-
Chen, A.1
Elsayed, E.A.2
-
10
-
-
84972539015
-
Neural networks: A review from a statistical perspective
-
CHENG, B. and TITTERINGTON, D. M., 1994, Neural networks: a review from a statistical perspective. Statistical Science, 9, 2-54.
-
(1994)
Statistical Science
, vol.9
, pp. 2-54
-
-
Cheng, B.1
Titterington, D.M.2
-
11
-
-
0001545483
-
Some properties of EWMA feedback quality adjustment schemes for drifting disturbance
-
DEL CASTILLO, E., 2001, Some properties of EWMA feedback quality adjustment schemes for drifting disturbance. Journal of Quality Technology, 33, 153-166.
-
(2001)
Journal of Quality Technology
, vol.33
, pp. 153-166
-
-
Del Castillo, E.1
-
12
-
-
0036567557
-
Closed-loop disturbance identification and controller tuning for discrete manufacturing processes
-
DEL CASTILLO, E., 2002a, Closed-loop disturbance identification and controller tuning for discrete manufacturing processes. Technometrics, 44, 134-141.
-
(2002)
Technometrics
, vol.44
, pp. 134-141
-
-
Del Castillo, E.1
-
14
-
-
0031124332
-
Run-to-run process control: Literature review and extensions
-
DEL CASTILLO, E. and HURWITZ, A., 1997, Run-to-run process control: literature review and extensions. Journal of Quality Technology, 29, 184-196.
-
(1997)
Journal of Quality Technology
, vol.29
, pp. 184-196
-
-
Del Castillo, E.1
Hurwitz, A.2
-
15
-
-
0032070696
-
An adaptive run-to-run optimizing controller for linear and nonlinear semiconductor processes
-
DEL CASTILLO, E. and YEH, J. Y., 1998, An adaptive run-to-run optimizing controller for linear and nonlinear semiconductor processes. IEEE Transactions on Semiconductor Manufacturing, 11, 285-295.
-
(1998)
IEEE Transactions on Semiconductor Manufacturing
, vol.11
, pp. 285-295
-
-
Del Castillo, E.1
Yeh, J.Y.2
-
16
-
-
0003964033
-
-
Cambridge, MA: Massachusetts Institute of Technology, Center for Advanced Engineering Studies
-
DEMING, W. E., 1986, Out of Crisis (Cambridge, MA: Massachusetts Institute of Technology, Center for Advanced Engineering Studies).
-
(1986)
Out of Crisis
-
-
Deming, W.E.1
-
17
-
-
0037056111
-
SISO run-to-run feedback controller using triple EWMA smoothing for semiconductor manufacturing processes
-
FAN, S.-K. S., JIANG, B. C., JEN, C. H. and WANG, C. C., 2002, SISO run-to-run feedback controller using triple EWMA smoothing for semiconductor manufacturing processes. International Journal of Production Research, 40, 3093-3120.
-
(2002)
International Journal of Production Research
, vol.40
, pp. 3093-3120
-
-
Fan, S.-K.S.1
Jiang, B.C.2
Jen, C.H.3
Wang, C.C.4
-
18
-
-
84948303872
-
Discussion
-
FATIN, W. F., HAHN, G. J. and TUCKER, W. T., 1990, Discussion. Technometrics, 32, 1-29.
-
(1990)
Technometrics
, vol.32
, pp. 1-29
-
-
Fatin, W.F.1
Hahn, G.J.2
Tucker, W.T.3
-
19
-
-
0000407245
-
Stability and sensitivity of an EWMA controller
-
INGOLFSSON, A. and SACHS, E., 1993, Stability and sensitivity of an EWMA controller. Journal of Quality Technology, 25, 271-287.
-
(1993)
Journal of Quality Technology
, vol.25
, pp. 271-287
-
-
Ingolfsson, A.1
Sachs, E.2
-
20
-
-
0025387954
-
Exponentially weighted moving average control schemes: Properties and enhancements
-
LUCAS, J. M. and SACCUCCI, M. S., 1992, Exponentially weighted moving average control schemes: properties and enhancements. Technometrics, 32, 1-29.
-
(1992)
Technometrics
, vol.32
, pp. 1-29
-
-
Lucas, J.M.1
Saccucci, M.S.2
-
21
-
-
0029288953
-
Choosing the EWMA parameter in engineering process control
-
LUCENO, A., 1995, Choosing the EWMA parameter in engineering process control. Journal of Quality Technology, 27, 162-168.
-
(1995)
Journal of Quality Technology
, vol.27
, pp. 162-168
-
-
Luceno, A.1
-
23
-
-
1642479120
-
EWMA-based bounded adjustment scheme with adaptive noise variance estimation
-
O'SHAUGHNESSY, P. and HAUGH, L., 2002, EWMA-based bounded adjustment scheme with adaptive noise variance estimation. Journal of Quality Technology, 34, 327-339.
-
(2002)
Journal of Quality Technology
, vol.34
, pp. 327-339
-
-
O'Shaughnessy, P.1
Haugh, L.2
-
24
-
-
0035518433
-
Identification and fine tuning of closed-loop processes under discrete EWMA and PI adjustments
-
PAN, R. and DEL CASTILLO, E., 2001, Identification and fine tuning of closed-loop processes under discrete EWMA and PI adjustments. Quality and Reliability Engineering International, 17, 419-421.
-
(2001)
Quality and Reliability Engineering International
, vol.17
, pp. 419-421
-
-
Pan, R.1
Del Castillo, E.2
-
25
-
-
0033890545
-
Adaptive optimization of run-to-run controllers: The EWMA example
-
PATEL, N. and JENKINS, S., 2000, Adaptive optimization of run-to-run controllers: the EWMA example. IEEE Transactions on Semiconductor Manufacturing, 13, 97-107.
-
(2000)
IEEE Transactions on Semiconductor Manufacturing
, vol.13
, pp. 97-107
-
-
Patel, N.1
Jenkins, S.2
-
26
-
-
84946637626
-
Control chart tests based on geometric moving averages
-
ROBERTS, S. W., 1959, Control chart tests based on geometric moving averages. Technometrics, 1, 239-250.
-
(1959)
Technometrics
, vol.1
, pp. 239-250
-
-
Roberts, S.W.1
-
27
-
-
0024029243
-
An adaptive estimation
-
SASTRI, T., 1988, An adaptive estimation. IIE Transactions, 20, 176-185.
-
(1988)
IIE Transactions
, vol.20
, pp. 176-185
-
-
Sastri, T.1
-
28
-
-
0036464285
-
Trajectory tracking in batch processes using neural controllers
-
SJOBERG, J. and AGARWAL, M., 2002, Trajectory tracking in batch processes using neural controllers. Engineering Applications of Artificial Intelligence, 15, 41-51.
-
(2002)
Engineering Applications of Artificial Intelligence
, vol.15
, pp. 41-51
-
-
Sjoberg, J.1
Agarwal, M.2
-
29
-
-
0031122513
-
A self-tuning EWMA controller utilizing artificial neural network function approximation techniques
-
SMITH, T. and BONING, D., 1997, A self-tuning EWMA controller utilizing artificial neural network function approximation techniques. IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part C, 20, 121-132.
-
(1997)
IEEE Transactions on Components, Packaging, and Manufacturing Technology - Part C
, vol.20
, pp. 121-132
-
-
Smith, T.1
Boning, D.2
-
30
-
-
0036565004
-
A neural-network approach for semiconductor wafer post-sawing inspection
-
Su, C.-T., YANG, T. and KE, C.-M., 2002, A neural-network approach for semiconductor wafer post-sawing inspection. IEEE Transactions on Semiconductor Manufacturing, 15, 260-266.
-
(2002)
IEEE Transactions on Semiconductor Manufacturing
, vol.15
, pp. 260-266
-
-
Su, C.-T.1
Yang, T.2
Ke, C.-M.3
-
32
-
-
21144472438
-
Model selection via multifold cross-validation
-
ZHANG, P., 1993, Model selection via multifold cross-validation. Annals of Statistics, 21, 299-311.
-
(1993)
Annals of Statistics
, vol.21
, pp. 299-311
-
-
Zhang, P.1
|