Simplified inverse Fourier transform technique to measure optical nonlinearity profiles using reference sample

Electronics Letters

Volumn 40, Issue 9, 2004, Pages 551-552

  Ozcan, A ^a   Digonnet, M J F ^a   Kino, G S ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANODES; FOURIER TRANSFORMS; LITHIUM NIOBATE; SECOND HARMONIC GENERATION; SILICA; VOLTAGE MEASUREMENT;

LASER INCIDENCE ANGLE; MAKER-FRINGE (MF) TECHNIQUE; TRIAL-AND-ERROR APPROACHES;

NONLINEAR OPTICS;

EID: 2542447443     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20040361     Document Type: Article

References (9)

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